Unlike the Digital Calibration Certificate (short: DCC), the fundamental concept of the DX Schema (short: DX) is to maintain a modular structure characterized by recurring types and elements. The Digital SchemaX can be viewed as a collection of types for metrology data, where these recurring types facilitate the consistent representation of various data points across different applications. This modular approach allows for the creation of a tree structure in the form of an independent document, designed to meet diverse needs in metrology.
The DX Schema inherits from the Digital SI, utilizing it for the system of units and physical quantities. This inheritance ensures seamless integration and consistency within existing systems. This foundation supports a broad ambition: The question is not, which science is dependent on metrology, but which science is not? The goal of DX is also to make metrology accessible to most sciences through digital transformation, so that by using its data types, one can apply metrology in their own projects. In contrast, while the DCC is specifically designed for the calibration and certification of measurements with a focus on structural elements that build a hierarchical framework, DX offers a broader and more flexible framework. The DCC can be complemented by unique types that enhance its functionality, but it primarily relies on the structural elements provided by the DX.
By maintaining a modular structure, individual components of DX can be easily replaced or expanded without impacting the entire system. This promotes the reusability and adaptability of data structures, which is particularly beneficial in dynamic and rapidly evolving fields like metrology.
Another key aspect of the DX Schema is its ability to represent complex hierarchies and relationships between different data points. This feature is especially useful for managing and analyzing large datasets, as it allows for a structured and organized presentation of information.
In summary, the DX Schema offers a flexible and efficient solution for managing and utilizing metrology data through its modular and extensible structure characterized by recurring types and elements. In contrast, the DCC provides a structured foundation through its hierarchical elements, which can be enhanced with specific types to meet the requirements of calibration and certification processes, while integrating and extending the proven standards of the Digital SI.
Illustration of the inheritance chain for the DX.
The new DCC in version 4.0 inherits the DX and there will be some other schemes like the Digital Test Certificate (short: DTC) too.